AFM Asylum Research CypherThis instrument captures topographical images of surfaces and is capable of measuring surface potential, surface conductivity, and mechanical properties.
AFM Bruker ICONThis instrument captures topographical images of surfaces with Z accuracy lower than 1 nanometer, and measure relative mechanical performance within a sample.
AFM Molecular Vista Photoinduced Force MicroscopeThis instrument captures topographical images of surfaces while simultaneously collecting location specific information of chemical makeup through an IR laser.
Apreo Variable Pressure SEMThe Apreo is a versatile, high-performance Scanning Electron Microscope (SEM) capable of 1-nanometer resolution on a wide variety of materials.
Confocal MicroscopeLaser scanning confocal microscopy has the ability to optically section whole specimens such as cells and small organisms.
Dimple GrinderThis instrument is used in the preparation of hard (conventional) materials for TEM analysis.
Dual Beam SEM-FIBThe XL830 dual beam workstation is a single platform for both hi-resolution electron/ion imaging and site specific milling for a variety of applications.
EllipsometerEllipsometry is used for determination of thicknesses and optical parameters of thin films and multilayers.
EVOS FL AutoThe EVOS FL Auto is a light microscope capable of capturing brightfield or fluorescence images.
Glow Discharge Optical Emission SpectrometryGlow Discharge Optical Emission Spectrometry is a destructive elemental analysis technique which gives depth resolution up to ~1 mm deep with down to 10 nm resolution.
Isothermal Titration CalorimetryIsothermal Titration Calorimetry provides the researcher with a simple, robust and accurate technique to determine the thermodynamics of protein-protein or protein-ligand interactions.
NanoindenterThis instrument can find the hardness, modulus, and other mechanical properties of very small materials by creating nanosized indentations.
Plasma CleanerAn advanced plasma cleaning system for removal of hydrocarbon contamination on TEM and SEM samples.
ProfilometerProfilometry is a technique used to extract topographical data from a surface, such as surface roughness, thickness, and stress properties.
QCM-DQuartz Crystal Microbalance with Dissipation monitoring (QCM-D) is a real-time, surface sensitive technique for analyzing surface-interaction phenomena, thin film formation and layer properties.
Raman Microscope/ SpectrometerRaman scattering is a fundamental form of molecular spectroscopy and can be used to obtain information about the structure and properties of molecules from their vibrational transitions.
Sample CoaterThe Leica ACE600 is a versatile high vacuum film deposition instrument for FE-SEM and TEM sample preparation.
SEM In-situ IndenterThis instrument can be used to test hardness, modulus of elasticity, residual stress, time-dependent creep and relaxation, fracture toughness and fatigue on thin films without removing the substrate.
TEM Ion MillIon milling is used to thin semiconductors, ceramics, and metals to electron transparency for TEM studies.
Time of Flight Secondary Ion Mass Spectrometer (ToF-SIMS)This instrument can generate chemically specific spectra and images from almost any surface.
Transmission Electron Microscope (TEM FEI Tecnai)The Tecnai G2 F20 Supertwin TEM is a highly advanced, state-of-the-art 200 kV transmission electron microscope (with STEM capabilities).
Transmission Electron Microscope with cryo (TEM FEI Tecnai)The Tecnai G2 F20 Supertwin TEM is a highly advanced, state-of-the-art 200 kV transmission electron microscope (with STEM capabilities).
Ultrafast transient absorption and photoluminescence spectroscopyFemtosecond laser with transient absorption and time-resolved photoluminescence detection capabilities.
Ultrasonic Disc CutterCuts 3mm diameter TEM samples from hard, brittle materials without mechanical or thermal damage.
Vibromet PolisherThe Vibromet 2 is a vibratory polisher designed to prepare high quality surfaces for Z-contrast SEM imaging and electron back-scatter diffraction (EBSD).
X-ray Absorption Near Edge Spectroscopy: CEI-XANESX-ray absorption near edge spectroscopy provides information about the coordination chemistry and oxidation state of transition metal elements.
X-ray Diffractometer (XRD)This instrument can be used to assess a material's phase composition, crystallinity, texture, and residual stress.
X-ray Photoelectron Spectroscopy (XPS)This instrument can be used to obtain information about the chemical composition of a surface.
XL30 SEMThe Sirion XL30 scanning electron microscope provides high resolution low kV secondary electron imaging from conductive and Au/Pd-coated samples.