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AFM Asylum Research Cypher

This instrument captures topographical images of surfaces and is capable of measuring surface potential, surface conductivity, and mechanical properties.

AFM Bruker ICON

This instrument captures topographical images of surfaces with Z accuracy lower than 1 nanometer, and measure relative mechanical performance within a sample.

Apreo Variable Pressure SEM

The Apreo is a versatile, high-performance Scanning Electron Microscope (SEM) capable of 1-nanometer resolution on a wide variety of materials.

Confocal Microscope

Laser scanning confocal microscopy has the ability to optically section whole specimens such as cells and small organisms.

Dimple Grinder

This instrument is used in the preparation of hard (conventional) materials for TEM analysis.

Dual Beam SEM-FIB

The XL830 dual beam workstation is a single platform for both hi-resolution electron/ion imaging and site specific milling for a variety of applications.

Ellipsometer

Ellipsometry is used for determination of thicknesses and optical parameters of thin films and multilayers.

EVOS FL Auto

The EVOS FL Auto is a light microscope capable of capturing brightfield or fluorescence images.

Isothermal Titration Calorimetry

Isothermal Titration Calorimetry provides the researcher with a simple, robust and accurate technique to determine the thermodynamics of protein-protein or protein-ligand interactions.

Nanoindenter

This instrument can find the hardness, modulus, and other mechanical properties of very small materials by creating nanosized indentations.

Plasma Cleaner

An advanced plasma cleaning system for removal of hydrocarbon contamination on TEM and SEM samples.

Profilometer

Profilometry is a technique used to extract topographical data from a surface, such as surface roughness, thickness, and stress properties.

QCM-D

Quartz Crystal Microbalance with Dissipation monitoring (QCM-D) is a real-time, surface sensitive technique for analyzing surface-interaction phenomena, thin film formation and layer properties.

Raman Microscope/ Spectrometer

Raman scattering is a fundamental form of molecular spectroscopy and can be used to obtain information about the structure and properties of molecules from their vibrational transitions.

Sample Coater

The Leica ACE600 is a versatile high vacuum film deposition instrument for FE-SEM and TEM sample preparation.

SEM In-situ Indenter

This instrument can be used to test hardness, modulus of elasticity, residual stress, time-dependent creep and relaxation, fracture toughness and fatigue on thin films without removing the substrate.

TEM Ion Mill

Ion milling is used to thin semiconductors, ceramics, and metals to electron transparency for TEM studies.

Ultramicrotome

Ultramicrotome for preparing sample sections from 20 nm to 20 microns.

Ultrasonic Disc Cutter

Cuts 3mm diameter TEM samples from hard, brittle materials without mechanical or thermal damage.

Vibromet Polisher

The Vibromet 2 is a vibratory polisher designed to prepare high quality surfaces for Z-contrast SEM imaging and electron back-scatter diffraction (EBSD).

X-ray Diffractometer (XRD)

This instrument can be used to assess a material's phase composition, crystallinity, texture, and residual stress.

XL30 SEM

The Sirion XL30 scanning electron microscope provides high resolution low kV secondary electron imaging from conductive and Au/Pd-coated samples.