By combining a high-efficiency Cu anode microfocus x-ray source and an extremely sensitive Pilatus 100K large-area 2D detector, the Bruker D8 powder x-ray diffractometer delivers some of the shortest acquisition times available. Additionally the 2D detection system gives unique information such as film orientation and strain, not easily achievable with traditional powder diffractometers. Since the instrument operates in a collimated beam geometry (0.05-2 mm beam diameter), only a very small amount of sample is necessary (less than 1 mg), and good diffraction can be collected from non-flat surfaces. The Pilatus 100K is capable of suppressing fluorescence from most samples (e.g. those containing Fe), and is not damaged by being hit with the main beam. Phase Identification, Phase Quantification (or % crystallinity), Texture, Stress, High Throughput Screening, MicroDiffraction, Mapping and more can be done faster and more easily on this system. The system also can be used with a Lynxeye-XET multi-strip 1D detector. This allows for higher resolution, Rietveld quality data collection. A temperature controlled sample stage is also available for measurements from -100 to 350 °C with the sample in vacuum atmosphere.