Bruker’s Hysitron nanoindenter utilizes capacitive transducer technology that deliver nN force and sub-angstrom displacement measurement capabilities for unbeaten nanoscale mechanical characterization. This indenter is also capable of SPM Imaging, environmental temperature control, high speed property mapping, scratch tests, and dynamic nanoindentation. The hysitron has many additional components including a high load cell, a heated stage, a conductive stage, and a conductive tip that will allow for a variety of different experimental set ups. The Hysitron can be set up with two different tips at one time, and multiple tip geometries are available upon request including berkovich, flat punch, cube corner, and conical.