Molecular Analysis Facilty Tool


Make/Model: Bruker OM-DektakXT
Location: MolES G44G
  • Full Description

Profilometry is a technique used to extract topographical data from a surface. For example it can be used to quantify surface roughness, thickness, and stress properties of materials. Its capabilities are diverse, in which it can measure film thicknesses from sub nanometer to 1 mm with angstrom repeatability.