The ICON is our most user-friendly AFM capable of both contact and tapping mode and is also equipped with our largest sample mounting stage allowing multiple samples to be mounted at once. This AFM also employs a technique developed by Bruker called "ScanAsyst" and this method auto optimizes imaging parameters producing very high-quality publishable images allowing a user to focus on the size and location of the image and sample. This technique also applies a force curve at each pixel to obtain a hardness map of the surface. This AFM can also be coupled with other techniques to measure topography in liquids, force spectroscopy, electrical and other properties of thin films.