Molecular Analysis Facilty Tool

Ellipsometer

Make/Model: Woollam M-2000
Location: MolES G43F
  • Full Description
  • Tool Resources

Ellipsometry is used for determination of thicknesses and optical parameters of thin films and multilayers.

Spectral Range: 210-1700 nm
Scan Speed: < 10 s for collection of entire spectral range Spot Size: Normal > 1.5 mm, Focused <150 µm
Sample mapping 150X150 mm
Sample Alignment: Automated
Imaging: Integrated CCD camera
Heating Option: Room temp to 300 *C