Tool Search

AFM - Molecular Vista PiFM
AFM Bruker ICON
AFM CypherES
Apreo Variable Pressure SEM
Bruker D8 Discover with IμS 2-D XRD System
capillary Differential Scanning Calorimeter
Critical Point Drier
Dektak Profilometer
Dimple Grinder
Dual beam UV/vis
Dualbeam FIB-SEM
Electron Back-Scatter Diffraction (EBSD) - Apreo SEM
Energy Dispersive X-ray Spectroscopy (EDS) - Dualbeam FIB-SEM
Energy Dispersive X-ray Spectroscopy (EDS) - XL30 SEM
EVOS
Falling Ball Viscometer
Gatan Solarus Plasma Cleaner
GDOES
In-situ SEM Indenter
Ion Mill
IONTOF TOF.SIMS 5 Time-of-flight secondary ion mass spectrometer
Isothermal Titration Calorimeter
Kratos Axis Ultra DLD X-ray Photoelectron Spectrometer
Lapping/Polishing Station
Laser Confocal Microscope
Light-Microscopes
Low-Speed Diamond Saw
Nanoindenter
Plasma Cleaner Femto
Polisher--Bruker-Vibromet2
QCM-D
Renishaw Raman Confocal
SEM Sample Coater
Sirion XL30 SEM
SPR
Sum Frequency Generation
Surface Plasmon Resonance - Biacore T200
Surface Science Instruments S-Probe X-ray Photoelectron Spectrometer
Tecnai G2 F20 SuperTwin
TEM Tecnai F20 Twin Cryo/In-situ
Transient Absorption-Time Resolved Photoluminescence
Ultracut 6 Microtome
Ultrasonic Disc Cutter
Woollam Spectroscopic Ellipsometer
XANES--BL1