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The photoinduced force microscope (PiFM) has a tunable IR laser coupled with its AFM capabilities.  This allows for the study of IR absorption from 750-1800 cm-1 while collecting AFM images with ~10-50nm resolution.  

Atomic force microscopy (AFM) is a scanning probe technique that utilizes a tip to obtain topographic information on nano and sometimes atomic scales. The sharp tip is attached to a cantilever, where the change in cantilever position can be tracked using a laser reflected off the back of the cantilever. 

The TFS Apreo variable-pressure SEM is a hi-resolution SEM capable of 1nm resolution and excellent back-scatter contrast.

By combining a high-efficiency Cu anode microfocus x-ray source and an extremely sensitive Pilatus 100K large-area 2D detector, the Bruker D8 powder x-ray diffractometer delivers some of the shortest acquisition times available. Additionally the 2D detection system gives unique information such as film orientation and strain, not easily achievable with traditional powder diffractometers. Since the instrument operates in a collimated beam geometry (0.05-2 mm beam diameter), only a very small amount of sample is necessary (less than 1 mg), and good diffraction can be collected from non-flat surfaces. The Pilatus 100K is capable of suppressing fluorescence from most samples (eg those containing Fe), and is not damaged by being hit with the main beam. This allows SAXS and GID measurements without a beamstop. Phase Identification, Phase Quantification (or % crystallinity), Texture, Stress, High Throughput Screening, MicroDiffraction, Mapping and more can be done faster and more easily on this system. The system also can be used with a Lynxeye-XET multi-strip 1D detector. This allows for higher resolution, Rietveld quality data collection, and x-ray reflectivity (XRR) measurements. A temperature controlled sample stage is also available for measurements from -100 to 350 °C with the sample in vacuum atmosphere.

Measurment of domain stability, melting temperature, and total thermodynamic determination of protein unfolding

Profilometer for measuring sub-nanoscale to millimeter scale film thicknesses, roughness, and thin film tensile and compressive stressed.

Dual beam UV/vis spectrophotometer, photodiode array detector, no thermal control

FEI XL830 dual-beam SEM-FIB is a single platform for both hi-resolution electron/ion imaging and site specific milling for a variety of applications. The electron beam allows observation of samples while the FIB accomplishes nano-machining of samples and devices for device editing, failure analysis, and sublayer observation.

Oxford Insruments Symmetry Electron Back-Scatter Diffraction (EBSD) with Energy Dispersive Spectroscopy (EDS) allows grain analysis of samples in the Apreo SEM sample chamber.

The Oxford Instruments Energy Dispersive X-ray Spectrometer (EDS) system allows elemental microanalysis of samples in the dual beam sample chamber.

The Oxford Instruments Energy Dispersive X-ray Spectrometer (EDS) system allows elemental microanalysis of samples in the SEM sample chamber.

The EVOS FL Auto is a light microscope capable of capturing brightfield or fluorescence images.  The instrument has light cubes for measuring DAPI, GFP and Texas Red.  It is equipped with an automated stage and simple control interface for ease of use in capturing images.

The Horiba GD-Profiler 2 gives rapid depth-resolved elemental analysis with down to 5 nm resolution. The instrument uses an Ar plasma to sputter a 2 mm or 4 mm diameter crater into the sample, and uses atomic emission spectroscopy to identify the material being sputtered away. The sputtering rate is variable, but is approximately 10 microns per minute. Detectable elements are highlighted in the image at right.

The Alemnis Standard Assembly (ASA) allows mechanical testing of samples in the SEM chamber with video capture.

X-ray Photoelectron Spectroscopy (XPS) (which is also known as ESCA) exploits the photoelectric effect to obtain information about the chemical composition of a surface. XPS can identify all elements (except H and He) present in the outermost 10 nm of a surface that are in concentrations greater than 0.1 atomic %. The elemental composition of a surface can be quantified (±10% or better). High-resolution XPS spectra can provide information about the molecular environment of a particular element (oxidation state, bonding atoms, etc.) Since the major components of the XPS systems are under computer control, automated data acquisition is possible allowing the instrument to be used 24/7.

Confocal Microscope for optical section of whole specimens.; Excitation at 458,477,488,514,543, and 643nm

Raman spectrometer with confocal microscope for characterization of bulk and nanoscale samples.

The Leica EM ACE600 is a sample preparation tool that applies conductive coatings to SEM samples prior to analysis.

Field Emission SEM with secondary and back-scatter electron imaging and Energy Dispersive X-ray Spectroscopy.

Picosecond vibrational sum frequency generation spectroscopy system.

The T200 allows for characterizing molecular interactions including: kinetics, affinity, specificity, concentration, immunogenicity, epitope binning, and transition-state thermodynamics.

X-ray Photoelectron Spectroscopy (XPS) (which is also known as ESCA) exploits the photoelectric effect to obtain information about the chemical composition of a surface. XPS can identify all elements (except H and He) present in the outermost 10 nm of a surface that are in concentrations greater than 0.1 atomic %. The elemental composition of a surface can be quantified (±10% or better). High-resolution XPS spectra can provide information about the molecular environment of a particular element (oxidation state, bonding atoms, etc.) Since the major components of the XPS systems are under computer control, automated data acquisition is possible allowing the instrument to be used 24/7.

200 kV HR transmission electron microscope with DF scanning capabilities (S/TEM), EDAX Elite-T EDS, diffraction, and tomography. Supplied with a Gatan Ultrascan CCD digital camera. Point to point resolution is 0.24 nm with information limit of 0.102 nm. 

Tecnai G2 F20 Twin TEM is a highly advanced, state-of-the-art 200 kV transmission electron microscope  with an unrivaled task-oriented user interface. Running under Windows XP operating system, it offers high performance with versatility and high productivity with ease of use. With 0.27 nm point to point resolution and 0.144 information limit, the TEM allows for imaging of a variety of samples from atoms to large features such as biological cells. This microscope is mainly used for soft materialsCapabilities of the MAF Tecnai TEM include:SAD or CBED diffraction, cryo transfer and holder, and in-situ liquid holder use.  The TEM is equipped with an FEI Eagle CCD camera. Complimented to the system is an FEI Vitrobot 2 for cryo sample preparation.

ToF-SIMS is a surface analytical method that provides chemically specific information about the upper 1-2 nm of a surface. The IONTOF TOF.SIMS 5 is capable of producing high mass resolution spectra (m/detlaM ~ 6000-10000) and high spatial resolution images (< 1 micron edge resolution) of any surface that can be placed in an ultra high vacuum environment. The TOF.SIMS 5 also has a gas cluster ion beam (GCIB) for sputtering which enables depth profiling of organic materials.

Femtosecond laser system with transient absorption and streak camera detectors capable of measuring photoexcited spectra, photoluminescence, and kinetics of thin film and solution phase samples.

Automatic cutting microtome for either wet or dry sectioning of 20 nm-several microns.

Used for determination of thicknesses and optical parameters of thin films and multilayers; Spectral range: 210-1700nm; Spot size: normal > 1.5 mm, focused <150 μm; Sample mapping; Heating option: to 300 °C