The Tecnai G2 F20 Supertwin TEM is a highly advanced, state-of-the-art 200 kV transmission electron microscope (with STEM capabilities).
This instrument can be used to obtain information about the chemical composition of a surface.
This instrument can generate chemically specific spectra and images from almost any surface.
The Tecnai G2 F20 Supertwin TEM is a highly advanced, state-of-the-art 200 kV transmission electron microscope (with STEM capabilities).
The Sirion XL30 scanning electron microscope provides high resolution low kV secondary electron imaging from conductive and Au/Pd-coated samples.
The Apreo is a versatile, high-performance Scanning Electron Microscope (SEM) capable of 1-nanometer resolution on a wide variety of materials.
This instrument can find the hardness, modulus, and other mechanical properties of very small materials by creating nanosized indentations.
The XL830 dual beam workstation is a single platform for both hi-resolution electron/ion imaging and site specific milling for a variety of applications.
Laser scanning confocal microscopy has the ability to optically section whole specimens such as cells and small organisms.
This instrument captures topographical images of surfaces while simultaneously collecting location specific information of chemical makeup through an IR laser.