This instrument can be used to obtain information about the chemical composition of a surface.
This instrument can generate chemically specific spectra and images from almost any surface.
Profilometry is a technique used to extract topographical data from a surface, such as surface roughness, thickness, and stress properties.
This instrument can find the hardness, modulus, and other mechanical properties of very small materials by creating nanosized indentations.
This instrument captures topographical images of surfaces while simultaneously collecting location specific information of chemical makeup through an IR laser.
This instrument captures topographical images of surfaces with Z accuracy lower than 1 nanometer, and measure relative mechanical performance within a sample.
This instrument captures topographical images of surfaces and is capable of measuring surface potential, surface conductivity, and mechanical properties.