X-ray Diffractometer (XRD)

This instrument can be used to assess a material's phase composition, crystallinity, texture, and residual stress.


The Sirion XL30 scanning electron microscope provides high resolution low kV secondary electron imaging from conductive and Au/Pd-coated samples.

Apreo Variable Pressure SEM

The Apreo is a versatile, high-performance Scanning Electron Microscope (SEM) capable of 1-nanometer resolution on a wide variety of materials.

Raman Microscope/ Spectrometer

Raman scattering is a fundamental form of molecular spectroscopy and can be used to obtain information about the structure and properties of molecules from their vibrational transitions.