Profilometry is a technique used to extract topographical data from a surface, such as surface roughness, thickness, and stress properties.
This instrument can find the hardness, modulus, and other mechanical properties of very small materials by creating nanosized indentations.
This instrument can be used to test hardness, modulus of elasticity, residual stress, time-dependent creep and relaxation, fracture toughness and fatigue on thin films without removing the substrate.
This instrument captures topographical images of surfaces while simultaneously collecting location specific information of chemical makeup through an IR laser.
This instrument captures topographical images of surfaces with Z accuracy lower than 1 nanometer, and measure relative mechanical performance within a sample.
This instrument captures topographical images of surfaces and is capable of measuring surface potential, surface conductivity, and mechanical properties.