X-ray Photoelectron Spectroscopy (XPS) (which is also known as ESCA) exploits the photoelectric effect to obtain information about the chemical composition of a surface. XPS can identify all elements (except H and He) present in the outermost 10 nm of a surface that are in concentrations greater than 0.1 atomic %. The elemental composition of a surface can be quantified (±10% or better). High-resolution XPS spectra can provide information about the molecular environment of a particular element (oxidation state, bonding atoms, etc.) The Kratos Axis Supra+ is designed for high-throughput automated data acquisition for both new and experienced XPS users. Up to three sample holders can be loaded into the instrument at any time. The ESCApe data acquisition software performs automated sample holder transfer and will automatically collect data defined by user methods. As a result, data acquisition can be performed 24/7. To accommodate air-sensitive samples, we have a gas purged glove box (nitrogen or argon options) to be used when loading samples into the instrument to minimize air exposure.