X-ray Photoelectron Spectroscopy (XPS) (which is also known as ESCA) exploits the photoelectric effect to obtain information about the chemical composition of a surface. XPS can identify all elements (except H and He) present in the outermost 10 nm of a surface that are in concentrations greater than 0.1 atomic %. The elemental composition of a surface can be quantified (±10% or better). High-resolution XPS spectra can provide information about the molecular environment of a particular element (oxidation state, bonding atoms, etc.)

The Kratos Axis Supra+ is designed for high-throughput automated data acquisition for both new and experienced XPS users. Up to three sample holders can be loaded into the instrument at any time. The ESCApe data acquisition software performs automated sample holder transfer and will automatically collect data defined by user methods.  As a result, data acquisition can be performed 24/7. 

To accommodate air-sensitive samples, we have a gas purged glove box (nitrogen or argon options) to be used when loading samples into the instrument to minimize air exposure. 

Additional techniques available:

Multi-contact sample holders to apply bias or current to samples

XPS parallel Imaging

Argon monatomic and Gas Cluster Ion Source (GCIS) for elemental depth profiling both inorganic and organic materials

Angle resolved XPS (AR-XPS) for non-destructive depth profiling

Ultraviolet Photoelectron Spectroscopy (UPS) with helium UV source

Ion Scattering Spectroscopy (ISS)

Hard X-ray Photoelectron Spectroscopy (HAXPES) with Ag L-α alpha x-rays

Temperature dependent XPS analysis of samples (-150° to 800°C)