Molecular Analysis Facilty Tool

XRD – Bruker D8 Discover

Make/Model: Bruker D8 Discover
Location: MolES G44G
By combining a high-efficiency Cu anode microfocus x-ray source and an extremely sensitive Pilatus 100K large-area 2D detector, the Bruker D8 powder x-ray diffractometer delivers some of the shortest acquisition times available. Additionally the 2D detection system gives unique information such as film orientation and strain, not easily achievable with traditional powder diffractometers. Since the instrument operates in a collimated beam geometry (0.05-2 mm beam diameter), only a very small amount of sample is necessary (less than 1 mg), and good diffraction can be collected from non-flat surfaces. The Pilatus 100K is capable of suppressing fluorescence from most samples (e.g. those containing Fe), and is not damaged by being hit with the main beam. The system also can be used with a Lynxeye-XET multi-strip 1D detector. This allows for higher resolution, Rietveld quality data collection.
  • Instrument Details

Key Capabilities

  • Phase Identification
  • Phase Quantification
  • Percentage Crystallinity
  • Texture Analysis
  • Residual Stress Analysis
  • Microdiffraction
  • Automated measurements
  • X-ray Reflectometry (with LynxEye 1D detector)
  • Temperature controlled sample stage (-100 to 350°C, in ambient or in vacuum atmosphere)


Data Produced

  • A 2D XRD pattern (with the Pilatus 100K 2D detector)
    • Can be used itself to qualitatively assess properties such as preferred orientation or grain size effects in the sample.
  • An x-y plot of intensity vs. the 2-theta angle which can be used for phase identification, crystallinity evaluation, and more (obtained through integrating the 2D data when collected with the Pilatus 2D detector).
  • Pole figures (texture analysis)


Example Applications

  • Identification of clay minerals in geological samples
  • Estimation of crystallite size in nanomaterials
  • Residual stress analysis of 3D printed materials
  • Structure analysis of battery materials
  • Crystallinity analysis of polymers


Compatible Samples

  • Loose powders (<40 micron grain size)
  • Films (recommended thickness at least ~50 nm)
  • Bulk samples ( < 3.5 cm in height)


Additional Information