Molecular Analysis Facilty ToolProfilometer Make/Model: Bruker OM-DektakXTLocation: MolES G44GProfilometry is a technique used to extract topographical data from a surface. For example it can be used to quantify surface roughness, thickness, and stress properties of materials. Its capabilities are diverse, in which it can measure film thicknesses from sub nanometer to 1 mm with angstrom repeatability. Instrument DetailsExample Data Key CapabilitiesMeasures thickness and roughness of solid samples from nm to mm scale Data ProducedHeight vs. length (single measurement) 3D map of sample surface Compatible SamplesResistant to minimum stylus force (2 mg)