Molecular Analysis Facilty Tool

Profilometer

Make/Model: Bruker OM-DektakXT
Location: MolES G44G
Profilometry is a technique used to extract topographical data from a surface. For example it can be used to quantify surface roughness, thickness, and stress properties of materials. Its capabilities are diverse, in which it can measure film thicknesses from sub nanometer to 1 mm with angstrom repeatability.
  • Instrument Details
  • Example Data

Key Capabilities

Measures thickness and roughness of solid samples from nm to mm scale

Data Produced

  • Height vs. length (single measurement)
  • 3D map of sample surface


Compatible Samples

Resistant to minimum stylus force (2 mg)