Molecular Analysis Facilty Tool

PECS2 Broadbeam Ion Mill

Make/Model: Gatan PECS II
Location: MolES G44M
This broad argon ion beam system is designed to polish and cross-section samples for SEM imaging and analytical techniques.
  • Instrument Details

Compatible Samples

Samples must be compatible with a chamber vacuum of 10-6 mBar. Planar polishing requires that samples are flat and have a maximum diagonal dimension of 25mm. Cross-section samples are limited to 9mm width (5mm is best.) The cross-sectional edge should be roughly polished prior to milling and the ion polish is localized to 1mm near the center of the fracture.