Molecular Analysis Facilty Tool

Ellipsometer

Make/Model: Woollam M-2000
Location: MolES G43F
Ellipsometry measures the change in polarization of reflected or transmitted light as it interacts with a material and is used for determination of thicknesses and optical parameters of thin films.
  • Instrument Details
  • Example Data

Key Capabilities

  • Spectral Range: 210-1700 nm
  • Scan Speed: < 10 s for collection of entire spectral range Spot Size: Normal > 1.5 mm, Focused <150 µm
  • Sample mapping 150X150 mm
  • Sample Alignment: Automated
  • Imaging: Integrated CCD camera
  • Heating Option: Room temp to 300 *C


Data Produced

  • Polarization changes as amplitude ratio and phase difference. Proper modeling required for material properties.


Compatible Samples

Thin Films

Additional Information