The Apreo-S is a versatile, high-performance, scanning electron microscope (SEM) capable of single-nanometer resolution and excellent back-scatter contrast on well-prepared materials. Oxford EDS and Symmetry EBSD enable high through-put elemental and grain orientation analysis. sTEM detector for ultra high-resolution imaging of electron transparent samples.

Key Capabilities:
The four available imaging modes are suitable for characterizing a wide range of materials.

1. Immersion mode with T1, T2, and T3 detectors generally gives the highest resolution images and is suitable for electrically conductive, non-magnetic samples.
2. Optiplan mode with T1, T2, and ETD detectors can approach 1nm resolution on conductive materials including magnetic samples.
3. Standard mode with T1 & ETD is suited to high-resolution imaging of rough and porous surfaces.
4. Low-vacuum mode controls sample charging, enabling SE & BSE imaging of materials with electrical resistance greater than 1010 Ohm without conductive coating.
   A hybrid 5th mode, compound lens filtering, is available to enhance compositional contrast on non-magnetic samples.

Additional detectors:
-A retractable sTEM detector with sub-nanometer resolution can quickly screen up to 6 TEM grids in one vacuum cycle.
-The retractable DBS detector with beam deceleration offers another charge control strategy and the ability to selectively mix or isolate topographic and compositional back scatter signals.
-Characteristic x-ray analysis and elemental mapping with Oxford EDS.
-Crystal orientation imaging with Oxford Symmetry EBSD.

Data Produced:
Secondary Electron, Back-scatter Electron, and sTEM micrographs
EDS spectra and maps
EBSD maps, grain statistics, mis-orientation and strain maps
Hi-Def tile sets of large sample areas