Electron Microscopy – Molecular Engineering & Sciences Institute

Transmission Electron Microscope with cryo (TEM FEI Tecnai)

The Tecnai G2 F20 Supertwin TEM is a highly advanced, state-of-the-art 200 kV transmission electron microscope (with STEM capabilities).

Transmission Electron Microscope (TEM FEI Tecnai)

The Tecnai G2 F20 Supertwin TEM is a highly advanced, state-of-the-art 200 kV transmission electron microscope (with STEM capabilities).

XL30 SEM

The Sirion XL30 scanning electron microscope provides high resolution low kV secondary electron imaging from conductive and Au/Pd-coated samples.

Apreo Variable Pressure SEM

The Apreo is a versatile, high-performance Scanning Electron Microscope (SEM) capable of 1-nanometer resolution on a wide variety of materials.

Dual Beam SEM-FIB

The XL830 dual beam workstation is a single platform for both hi-resolution electron/ion imaging and site specific milling for a variety of applications.

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