This broad argon ion beam system is designed to polish samples for SEM imaging and analytical techniques. The sample holder can accomodate samples up to 32 mm in diameter and 20 mm tall, however the polished area is around 10 mm2 in the center of the sample. Users are encouraged to do a literature search to see if they can find suitable settings to start with and should expect to need to do some trial and error to find settings that work for their samples.