X-ray absorption near edge spectroscopy provides information about the coordination chemistry and oxidation state of transition metal elements.
The Sirion XL30 scanning electron microscope provides high resolution low kV secondary electron imaging from conductive and Au/Pd-coated samples.
The Apreo is a versatile, high-performance Scanning Electron Microscope (SEM) capable of 1-nanometer resolution on a wide variety of materials.
Glow Discharge Optical Emission Spectrometry is a destructive elemental analysis technique which gives depth resolution up to ~1 mm deep with down to 10 nm resolution.
The XL830 dual beam workstation is a single platform for both hi-resolution electron/ion imaging and site specific milling for a variety of applications.