The Sirion XL30 scanning electron microscope provides high resolution low kV secondary electron imaging from conductive and Au/Pd-coated samples.

Apreo Variable Pressure SEM

The Apreo is a versatile, high-performance Scanning Electron Microscope (SEM) capable of 1-nanometer resolution on a wide variety of materials.

Dual Beam SEM-FIB

The XL830 dual beam workstation is a single platform for both hi-resolution electron/ion imaging and site specific milling for a variety of applications.