Bruker D8 Discover with IμS 2-D XRD System

By combining a high-efficiency Cu anode microfocus x-ray source and an extremely sensitive Pilatus 100K large-area 2D detector, the Bruker D8 powder x-ray diffractometer delivers some of the shortest acquisition times available. Additionally the 2D detection system gives unique information such as film orientation and strain, not easily achievable with traditional powder diffractometers. Since the instrument operates in a collimated beam geometry (0.05-2 mm beam diameter), only a very small amount of sample is necessary (less than 1 mg), and good diffraction can be collected from non-flat surfaces. The Pilatus 100K is capable of suppressing fluorescence from most samples (eg those containing Fe), and is not damaged by being hit with the main beam. This allows SAXS and GID measurements without a beamstop. Phase Identification, Phase Quantification (or % crystallinity), Texture, Stress, High Throughput Screening, MicroDiffraction, Mapping and more can be done faster and more easily on this system.

The system also can be used with a Lynxeye-XET multi-strip 1D detector. This allows for complete suppression of all fluorescence (even from Co containing samples), higher resolution, Rietveld quality data collection, and x-ray reflectivity (XRR) measurements. By combining the Lynxeye detector with an equatorial Soller slit, the system can measure grazing-incidence and in-plane grazing-incidence XRD (GIXRD and IPGIXRD) to amplify signal from very thin films and suppress substrate contributions.

A temperature controlled sample stage is also available for measurements from -160 to 350 °C with the sample in vacuum or inert gas atmosphere.

 

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